"Scan design called portal for hackers"

[Mark Armbrust]

At 23:21 2004-10-28 -0700, you wrote:
>
>EETimes 25 Oct 04 has an article about how 
>the testing structures on ICs makes them 
>vulnerable to attacks.  The basic idea is
>that to test a chip, you need to see inside
>it; this can also reveal crypto details 
>(e.g., keys) which compromise the chip.  

See EETimes Online:
http://www.eetimes.com/showArticle.jhtml?articleID=51200146

and papers by Ramesh Karri at:
http://cad.poly.edu/encryption/desscan_final.pdf
http://cad.poly.edu/encryption/aesscan.pdf

--Mark


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