"Scan design called portal for hackers"

Mark Armbrust mark.armbrust at pobox.com
Tue Nov 2 10:49:33 EST 2004

At 23:21 2004-10-28 -0700, you wrote:
>EETimes 25 Oct 04 has an article about how 
>the testing structures on ICs makes them 
>vulnerable to attacks.  The basic idea is
>that to test a chip, you need to see inside
>it; this can also reveal crypto details 
>(e.g., keys) which compromise the chip.  

See EETimes Online:

and papers by Ramesh Karri at:


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